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D&E Event

Design Automation & Embedded Systems

In Circuit vs. Functional Test, or why test at all?!

Testing is always a cost factor and need to be adjusted to the market needs. This presentation will talk about the different test aspects and highlights the pros and contras of each method. The final recommendation is to choose an adequate mix of the different test technologies to get the best coverage to the affordable cost.

Gerome Yacoub, Digital Test on behalf of CN Rood

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