This presentation will discuss considerations when moving test earlier in the design cycle. Test early and often to reduce cost and increase test coverage. It discusses Hardware in the Loop (HIL) testing, simulation and FPGA’s and addresses some real-world examples, including recalls because of a lack of attention to testing early. It addresses elements of a HIL system like using models for your tests, moving simulation to FPGAs and build versus buy considerations.
William Baars, C.N. Rood
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