The RTX2300 Smart ATE (Automated Test Equipment) is a highly-optimized automated test solution for manufacturing of wireless devices.
- a highly competitive and cost/time efficient test solution for functional test
- reducing the complexity and size of the ATE system by the combination of embedded measurement capabilities and add-on instrumentation modules
- flexible and enables a swift physical reconfiguration – in a matterof seconds
The RTX2300 SMART ATE can be used for printed circuit boards as well as for final product testing.
It features a customization area that enables interconnection between internal and external measurement functionality and the device under test (DUT); reducing both space requirements and complexity for the total test system.
The RTX2300 SMART ATE’S FLEXIBILITY SIMPLIFIES THE CUSTOMIZATION OF THE TEST PLATFORM and enables economical replication. A production test system can be implemented by using an RTX Smart ATE in combination with an RF communication tester and a PC for executing the test application.
The RTX2300 SMART ATE is more than jsut a shielded box – it includes embedded test instrumentation reducing the complexity, size and cost of an ATE system. These are a digital voltmeter, audio generator, GPIO and signal multiplexer.
The RTX2300 SMART ATE is customizable – it can be supplied with optional instrumentation in the form of add-on modules without the need for additional external equipment. Add-on modules include a programmable power supply or frequency counter, which allows for the calibration and test of the baseband circuitry of the DUT. A Bluetooth low energy RF tester module is also available for test of key paramaters in BLE devices. The RF-shielded compartment of the Smart ATE can be customized with a device-specific probe fixture, including a pneumatic capture unit to automatically hold the DUT in place during test.
The RTX2300 SMART ATE can decrease overall test time due to the support of multithreaded applications and design. This enables several units to be set up in parallel, enabling optimal use of RF, baseband, and acoustic test resource, thus effectively reducing the handling time of the DUTs. In addition, the Smart ATE can streamline the manufacturing process, since, in a matter of seconds, it can be physically reconfigured to accommodate different products and test types.
Datasheet : RTX2300