Lumiloop LSPM+ Tripple RF Power Meter housing option with Toch Screen and LAN connection capabilities AR Benelux likes to share to share with you, that theLumiloop LSPM+ has been released. The LSPM+ is an optional housing with touch display and LAN interface for the Lumiloop LSPM triple high speed power meters.The + option is available for the LSPM 1.0...
Lot of attention for TMT Margin Tester and FPGA 3D Scanning Demo
On Wednesday 19 April, CN Rood was an exhibitor at the Design Automation & Embedded Systems event in Den Bosch. During this well-attended event, CN Rood's stand featured many demonstrations. Shown were Tektronix's new TMT4 PCIe margin tester and the Pendulum Instruments CNT-104S Multi-channel Frequency Analyzer and, of course, Tektronix's Scope series. There was also a demonstration by NI (National...
4 Key Testing Phases for Power Conversion Equipment
Power conversion equipment is a critical component in modern electronics, from power supplies to energy storage and electric vehicles. To ensure these devices operate efficiently and reliably, a rigorous testing process is essential. With the adoption of wide-bandgap materials like silicon carbide (SiC) or gallium nitride (GaN), testing strategies have become more complex. In this blog, we will explore the...
Narda FieldMan – With ultrasonic distance meter
The ultrasonic distance meter of the Narda electromagnetic field meter precisely measures the height above ground where the FieldMan is being operated, which makes the exact positioning of the measuring device much easier. The measurement is accurate to within one centimeter, with a capture angle of 15 degrees and a range of 25 cm to 400 cm. The measurement units...
New RF Pulse Current Probes
Two RF Pulse monitoring probes were added to the Tekbox lineup of RF current probes to allow for time-domain measurements. The 3dB bandwidth of the model TBPCP1-20100 ranges from 20 Hz to 100 MHz. The 3 dB bandwidth of the model TBPCP2-3070 ranges from 30 Hz to 70 MHz. TBPCP1-20100 The TBPCP1-20100 is a RF pulse current monitoring probe,...
Pickering Interfaces introduces new high-spec 18-slot PXIe chassis
Gen2 performance available on short lead times; highly cost-competitive Pickering Interfaces, the leading supplier of modular signal switching and simulation solutions for use in electronic test and verification, launched its model 42-926-001 18-slot PXIe chassis, which offers Gen2 performance, is higher spec’d than competing models, with double the PXISA cooling spec per slot and more power to the backplane, and...
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Welkom op [RE]CONNECT (NIDays) in Eindhoven op 23/9
Op 23 September is er weer de jaarlijkse test en meettechnologie conferentie, in het verleden als NIDays door National Instruments (NI) georganiseerd. Ons nieuwe [RE]CONNECT EVENT vindt plaats op de Brainport Industries Campus, in Eindhoven. We zouden het erg waarderen je (weer) eens persoonlijk te kunnen ontmoeten. Vergroot je kennis, leer over de nieuwste technologieën en ontmoet en spreek andere...
Hioki Memory HiLoggers, 2020 Good Design Award !
Hioki Memory HiLoggers are high-speed data loggers for recording multiple channels of voltage, temperature, resistance or humidity signals, some models providing complete isolation between channels and strong noise resistance. The LR8450 offers 1 ms sampling across up to 120 channels, and can be paired with 5 different types of plug-in input units. New input modules measure strain and distortion, ideal...
High Power SourceMeasureUnits for Electrical Testing of High Power discrete devices
The 2650 Series High Power SourceMeter SMU Instruments are designed specifically for characterizing and testing high voltage/current electronics and power semiconductors, such as diodes, FETs, and IGBTs, high brightness LEDs, DC-DC converters, batteries, solar cells, and other high power materials, components, modules, and subassemblies. They deliver unprecedented power, precision, speed, flexibility, and ease of use to improve productivity in R&D,...
Probe Stations for on-wafer Electrical Characterization of High Power discrete devices
The High Power Probestations from MPI enable accurate on-wafer electrical measurements on High Power devices ( transistors, diodes, thryristors, etc ) up to 3 kV triaxial / 10 kV coaxial and 600 A (pulsed). MPI High Power Technologies include High Voltage, High Current and High Power Probes. High Power Chucks, with low contact resistance and gold plated chuck top, for...
