Challenges of Test & Measurement in the future
28 september 2022, 13:00 - 17:00
In a continuously changing world, the Test & Measurement area cannot be left behind.
This seminar takes you into the latest developments in the field of Test & Measurement in the design/development phase.
Programma
| Start & eindtijd | Beschrijving |
|---|---|
| 13:00 - 13:25 |
Early supplier involvement: how and when to decide about the test strategy Steven Van Hout, VDL TBP Electronics |
| 13:25 - 13:50 |
New systems and challenges for power electronic components testing Kees Revenberg, Eurofins | MASER |
| 13:50 - 14:15 |
Signal Fidelity starts with probes – Welcome to innovative Probing technology Sven de Coster, C.N. Rood |
| 14:15 - 14:30 |
Pauze |
| 14:30 - 14:55 |
See the World in a New Way by Thermal Imaging Marcel Wiechmann, Hikmicro (on behalf of Tooltronics) |
| 14:55 - 15:20 |
New EMC requirements for lighting equipment Adnan Moosabhoy, EMC Partner (on behalf of Rimarck) |
| 15:20 - 15:45 |
Titel volgt Acal BFI |
| 15:45 - 16:10 |
Titel volgt Accelonix |
Mediapartner
