Keithley Parametric Curve Tracer for electrical characterizion of High Power discrete devices
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley’s line of high power Parametric Curve Trace configurations supports the full spectrum of device types and test parameters. Keithley’s Parametric Curve Trace configurations include everything necessary for the characterization engineer to develop a complete test...