CN Rood and Tektronix will pay a lot of attention to Double Pulse Testing at the upcoming E&A fair. During the seminar “The influence of Hardware Design on Time-to-Market” Mr. Sushil Vohra of Tektronix will discuss the possibilities of Double Pulse Testing. At the CN Rood stand (stand 7C130) visitors will see a live demonstration of Double Pulse Testing using the Tekstronix 5 series MSO.

 

Minimizing switching losses

Minimizing switching losses remains a major challenge for engineers working with SiC and GaN. The standard test method for measuring switching parameters and evaluating the dynamic behavior of Si, SiC and GaN MOSFETs and IGBTs is the Double Pulse Test (DPT). This test measures the energy loss during switching the device on and off.

 

The Basics of Double Pulse Testing

A Double Pulse Test is performed using two devices. One device is the Device Under Test (DUT) and the second device is usually the same type as the DUT. The inductor is used to simulate circuit conditions that may occur in a converter design. Double Pulse Testing requires the following instruments: a power supply or SMU to provide the voltage, an arbitrary function generator (AFG) to output pulses that turn on the gate of the MOSFET to start conducting current, and an oscilloscope to measure the resulting waveforms. Visit the CN Rood booth for the live demo.

 

Lecture during Seminar 'The influence of Hardware Design on Time-to-Market'

The seminar 'The influence of Hardware Design on Time-to-Market' advises visitors to the fair on design for production, reliability and compliance for a shorter Time-to-Market. Sushil Vohra from Tektronix will give a lecture on Double Pulse Testing: 'The Standard Method for Measuring Switching Parameters' during this seminar. The lecture will take place from 14:15 - 14:40. Registration for the seminar is free.

 

Seminar 'The Impact of Hardware Design on Time-to-Market
Tuesday September 26 1:00 PM – 4:15 PM

 

register now for the fair and register for the seminar

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