Insight through characterization of uncertainties in S-parameter measurements
FHI, Federation of Technology Industries – November 10, 2020
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Before performing measurements with a VNA (Vector Network Analyzer), the measurement setup must be calibrated with a calibration kit to avoid system errors.
In addition to system errors in the measurement setup, there are also random errors that affect the accuracy of s-parameter measurements. If you do not quantify these random errors, the accuracy can only be guessed. During the presentation of Dirk Faber by Hi-Tech RF & Microwave Solutions learn which random errors affect the accuracy of s-parameter measurements. Also discussed will be how to gain insight into these random errors and how to reduce them. Read more…
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