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Floating differential measurements (such as high-side Vgs) are difficult or impossible to make due to high frequency (fast turn on and turn off), and the presence of high common mode voltages (such as Vds) affecting oscilloscope probes which do not have enough common mode rejection at high bandwidth. The poor common mode rejection leads to the measurement being dominated by the common mode error instead of the actual differential signal. This presentation will look at CMRR issues and the utilization of traditional versus galvanically isolated differential Probes for measuring GaN and SiC devices.
Sven de Coster, C.N. Rood
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