13.00 – 13.25
The switching performance of power semiconductors is often characterized using double pulse tests. This testing is now being widely applied to GaN and SiC MOSFETs. This presentation will discuss how to probe on Low side & High side of Mosfets and validate switching performance of SiC/ GaN devices.
Spreker: Mr. Sushil Vohra – Tektronix (on behalf of CN Rood)
English (UK)