10:00 – 10:25
In a rapidly innovating automotive market, Integrated Circuit (IC) manufacturers need to double their development speed by adopting platform-based, modular designs with configurable features. This shift also demands a new EMC verification approach, as exhaustive testing of all IC variants and application modes is no longer feasible. To mitigate this, the DECID-AI consortium will realize an intelligent diagnostic assistant (IDA) for ICs, based on risk-based reasoning, to detect and prevent EMC issues early in the design phase.
The IDA will support designers in making better decisions and will predict where EMC issues might arise. As a result, fewer physical testing and redesign cycles are needed, meaning new products can be developed faster and with fewer risks. This presentation outlines the core concepts and principles driving the development of the IDA.
Speaker: Patricia Joris – Melexis Technologies