Program

Elewijt, Belgium

Program

Times
Track 1
Track 2
09:30 – 09:55
Walk-in
10.00 – 10.25 am
Smarter, Faster Silicon: Risk-Based AI-driven Design for Electromagnetic Compatibility Patricia Joris – Melexis Technologies
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10:30 – 10:55
IC LEDs from an EMC perspective Raf Vleugels – Würth Elektronik Belgium
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What is an EMC test chamber and why would I need one? Marc Le Roy – Comtest Engineering
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11:00 – 11:25
Break
11.30 – 11.55 am
IEC 61000-4-2:2025 (Edition 3) | What has changed. Frank Niechcial – Accelonix
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Conductive floor testing is hard! Tim Maas – Total ESD Solutions & Pim Dik – Eurostat Benelux
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12.00 – 12.25 hrs
EMC shielding of electronic equipment in corrosive environments Leendert de Voogd – EEMC
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EMC compliance and testing: An overview Gert de Gooijer – Electrometric bv.
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12:30 – 13:25
Lunch
1:30 PM – 1:55 PM
Electromagnetic Compatibility (EMC) and Partial Discharge (PD) in the Context of Electrical Reliability – An Invisible, Crucial Connection Torsten Berth – Haefely
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CE Marking for Radio Equipment: Understanding RED Compliance De Nayer Laboratories
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2:00 PM – 2:25 PM
Beyond the EMC Chamber: Practical In-Situ Measurements for Real-World Systems Remco de Boer – Rohde & Schwarz Benelux
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14:30 – 14:55
Break
3:00 PM – 3:25 PM
3:30 – 3:55 PM
16:00
Drinks
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