RF Probe Comparison for Characterizing Passive and Active Devices

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Active components Communicatie technologie HF-RF Componenten HF-RF Protocols Design Service Industriële Elektronica

This application note discusses the probe comparison measurement methods and results for both passive and
active devices. The comparison for passive devices was undertaken by AIST, the National Metrology Institute
(NMI) of Japan. It demonstrated that the TITAN™ Probe T110A-GSG0100 provided identical measurement results
as the reference i110-A-GSG-100 probe.

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RF Probe Comparison for Characterizing Passive and Active Devices

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