RF Probe Comparison for Characterizing Passive and Active Devices

RF Probe Comparison for Characterizing Passive  and Active Devices Door: CN Rood

This application note discusses the probe comparison measurement methods and results for both passive and 
active devices. The comparison for passive devices was undertaken by AIST, the National Metrology Institute 
(NMI) of Japan. It demonstrated that the TITAN™ Probe T110A-GSG0100 provided identical measurement results 
as the reference i110-A-GSG-100 probe.

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