Industry’s first PXI LCR & SMU combo instrument
Many semiconductor elements and electronics devices require both current-voltage (IV) and capacitance-voltage (CV) measurements to extract critical information about a manufacturing process or validate device performance. Traditionally, IV measurements are made with a source measure unit (SMU), and the CV measurements are made with an LCR meter, capacitance measurement unit (CMU), or impedance analyzer. Systems needing both CV and IV...